Neutral guides to test and measurement, data acquisition, sensors and industrial automation.
Independent, vendor-neutral guides to test and measurement, data acquisition, sensors, embedded systems and industrial automation for engineers.
Structured reference guides for instrumentation, data acquisition, and automated testing.
Instruments, measurement methods and how to choose test equipment.
Browse topics →Sensors, signal conditioning and data acquisition explained.
Browse topics →Industrial automation and embedded control for test systems and machines.
Browse topics →Recently updated tutorials, measurement procedures, and system designs.
Sensors and DAQCompare dynamic versus static strain gauge measurement across monotonic microstrain range, cyclic S-N fatigue life, thermal output zero drift, and excitation limits.
Sensors and DAQPartition an automated test bench across a precision DMM, digital oscilloscope, and modular DAQ using IEEE 1241 ENOB, NPLC power-line rejection, CAT II isolation, and sensor bandwidth.
Sensors and DAQSize strain gauge amplifier gain, excitation power density, 6-wire Kelvin remote sensing, DC vs AC carrier demodulation, anti-aliasing filters, and shunt calibration.
Sensors and DAQMatch a thermocouple, Pt100, or NTC to the DAQ using IEC 60751 ranges, ASTM E230-87 tolerances, and the excitation current that heats the sensor.
Sensors and DAQReduce rectangular 0/45/90 and delta 0/60/120 strain gauge rosette readings to principal strains and direction, with an assumed-reading angle example.
Sensors and DAQCompare quarter, half and full strain gauge bridges by output, gauge placement, temperature cancellation and bending rejection, with a worked voltage-ratio example.
Maximizing Value at NI is an independently operated information site about test and measurement. It offers vendor-neutral explainers on data acquisition, sensors, embedded systems and industrial automation for engineers choosing and using test equipment.